Tin thin film electrodes were sputtered onto the current collector of a recently developed in situ X-ray diffraction (XRD) and were monitored continuously by XRD while cycling. A phase transformation ...

292-296. doi:10.1063/1.1661876 [2] C. Ozgit, I. Donmez, M. Alevli and N. Biyikli, “Self-Limiting Low-Temperature Growth of Crystalline AlN Thin Films by Plasma-Enhanced Atomic Layer Deposition,” Thin ...

How can we help you? The diffractometer is designed for thin film XRD applications such as GIXRD, HRXRD, XRR, orientation mapping and high-throughput XRD mapping. X-ray source: Cu Ka LFF (2.2 kW) ...

The University of Waterloo acknowledges that much of our work takes place on the traditional territory of the Neutral, Anishinaabeg, and Haudenosaunee peoples. Our main campus is situated on the ...

The XRD patterns were recorded in the 2θ range of 20-80˚ with ... was deposited on the film using physical vapour deposition. Chemical structure of thin film was examined by FTIR technique (Model: ...

In the semiconductor industry, 2D-XRD is used to characterize the epitaxial growth of thin films, assess the quality of single crystals, and investigate the strain and defects in device structures.

A wide range of X-ray diffraction techniques is available within the facility for the investigation of polycrystalline materials, single crystal and thin films. Samples may be examined in either bulk ...

Thin Films,X-ray Diffraction,X-ray Diffraction Spectroscopy,X-ray Photoelectron Spectroscopy,Back Contact,Band Gap,Carrier Collection,Carrier Concentration,Depletion Region,Acceptor ...

How can we help you? X-ray diffraction from polycrystalline materials, in the form of powder, bulk and thin films can be carried out to identify the phases present in the material. Further analysis ...